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  3. マーポス
  4. Notice of Participation in SEMICON Japan 2021 Hybrid
SEMINAR_EVENT
  • Nov 15, 2021
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Nov 15, 2021

Notice of Participation in SEMICON Japan 2021 Hybrid

マーポス マーポス
Our company will be exhibiting at "SEMICON Japan 2021 Hybrid" held at Tokyo Big Sight starting from Wednesday, December 15, 2021. (Booth number: 1720) At this exhibition, we will mainly showcase semiconductor industry-specific applications and non-contact measuring instruments related to the improvement of reliability and performance in semiconductor manufacturing processes. We sincerely look forward to seeing you at our booth. Exhibited products: - Non-contact thickness measurement gauge (interferometry technology) - Non-contact distance/thickness measuring instrument (chromatic confocal technology) - Laser outer diameter measurement gauge, etc.
SEMICON Japan 2021 Hybrid
SEMICON Japan 2021 Hybrid
Date and time Wednesday, Dec 15, 2021 ~ Friday, Dec 17, 2021
10:00 AM ~ 05:00 PM
Pre-registration is required for entry to this exhibition.
Capital Tokyo Big Sight (East Exhibition Hall)
Entry fee Free Entry to this exhibition requires prior registration.
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Related product

image_01.png

Optical Interference Measuring Instrument 'NCG'

Shorten cycle time! A versatile and easy-to-use optical interference measuring instrument designed for convenience.

The "NCG" is a thickness measurement device using optical interference technology. It calculates and measures the thickness of layers through the interference caused by the reflection of light waves at the joint surface of the workpiece. It is designed to manage the thickness of different materials such as glass, plastic, and silicon wafers. This product can be connected to various machines, allowing for high-precision and high-speed management of component thickness, and can be used in dry or wet environments within the specified limits of the specifications, either on the machine or inside the machine. 【Features】 ■ Guarantees processing accuracy within the desired tolerance ■ Reduces cycle time ■ Control for maintaining stable production under controlled conditions ■ Compensation for mechanical variations ■ History of measurement results *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Optical Measuring Instruments

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IRIX_01_s.jpg

Non-contact measurement solution for film thickness measurement 'IRIX'

A non-contact sensor using chromatic confocal technology measures the distance and thickness of various materials that transmit white light.

By combining a diverse family of optical probes and controllers with various measurement ranges, mechanical dimensions, and measurement specifications, we can meet a wide range of application needs. We offer two models: the single-channel "CPS1" and the dual-channel "CPS2." <Features> - Capable of measuring various materials that can reflect white light (e.g., metals, glass, plastics, coatings, liquids) - Non-contact measurement possible in all cases where contact with the subject is not required - Can measure up to five layers of transparent layers simultaneously with a single optical probe - High measurement accuracy - Replaceable sensors (up to 32 maps can be saved, suitable probes can be used) - 7-inch integrated display - Passive optical probe unaffected by thermal or electrical noise - Easily integrable into any system using SDK and protocol commands - Reduction of measurement spot - Dynamic collection possible through measurements synchronized with an encoder (spatial synchronization) - Capable of measuring roughness *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Optical Measuring Instruments

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WIRELINE.XY.JPG

Laser System "WIRELINE.XY"

High-precision and reliable wire diameter measurement without the need for frequent gauge cleaning! The quality of molded products and process capability is demonstrated in printed reports.

"WIRELINE.XY" is a laser measurement system designed for monitoring the diameter/ovality of iron and copper wires. This system is specifically designed for wire measurement, allowing for high-precision and reliable diameter measurements of wires without being affected by vibrations or speeds during the wire drawing process. Even in environments where soap residue and iron powder can quickly clog the sensors and significantly impact measurement accuracy, it can be used on dry wire drawing benches thanks to a newly patented dust-proof bracket. 【Features】 ■ Patented pneumatic protection system eliminates the need for frequent gauge cleaning ■ Non-contact measurement enabled by laser technology ■ 100% tolerance checks possible through online applications ■ Significant material savings: production within tolerances through control ■ Contributes to labor cost reduction with automatic control functions ■ Improves product quality and reduces waste

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Related catalog(5)

Optical Interference Measuring Instrument 'NCG'

Optical Interference Measuring Instrument 'NCG'

PRODUCT
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Chromatic Confocal Technology Non-Contact Measurement Solution 'IRIX'

Chromatic Confocal Technology Non-Contact Measurement Solution 'IRIX'

DOCUMENT
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  • Catalog download

Contact this catalog

Chromatic confocal technology, non-contact measurement solution for thickness measurement 'STIL'

Chromatic confocal technology, non-contact measurement solution for thickness measurement 'STIL'

CATALOG
  • E-book viewing
  • Catalog download

Contact this catalog

Laser System "WIRELINE.XY"

Laser System "WIRELINE.XY"

PRODUCT
  • E-book viewing
  • Catalog download

Contact this catalog

Handy Wire Scanner 'HWS.3'

Handy Wire Scanner 'HWS.3'

PRODUCT
  • E-book viewing
  • Catalog download

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Notice of Participation in the Fukushima Industrial Exchange Fair on January 22, 2026 (Thursday)

  • NEW
  • SEMINAR_EVENT

Our company will exhibit at the "Reiwa 7th Year Fukushima Industrial Exchange Fair," held at Pulse Iizaka, as our first exhibition to kick off 2026. This fair aims to expand new business transactions and create business opportunities within the region, as well as to promote interaction and collaboration with universities and support organizations. ★ Participating Industry Sectors Machinery, Electronics, Metals / Medical, Welfare / Robotics, Aerospace / Food Processing Environment, Energy / Information, IT / Universities, Support Organizations / Regional Municipalities On the day of the event, we will showcase a variety of popular injection-molded products and resin-cutting processed items, so please feel free to stop by the IIDA booth. 【Iida Manufacturing Co., Ltd. Fukushima No. 2 Factory】 〒969-1204 21-2 Mizukami, Nukazawa, Motomiya City, Fukushima Prefecture TEL: 0243-64-2320 FAX: 0243-64-2571

Jan 12, 2026

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January 28, 2026 (Wednesday) 13:30 - "Operational Amplifier Classroom - What is an Operational Amplifier?"

  • NEW
  • SEMINAR_EVENT

The highly acclaimed program "Basic Course Series on Analog ICs" by Nisshinbo Micro Devices, which received over 300 applications last time, is back. This time, we will hold the very popular "Operational Amplifier Classroom - What is an Operational Amplifier?" We will introduce the basic functions of operational amplifiers. The difficulty level is beginner, so whether you are new to analog ICs or have some questions, we encourage you to participate! With the latest 2026 recorded lectures and live Q&A sessions with engineers, even busy engineers can learn efficiently. ● Target Participants New employees, young designers Those who want to relearn about analog ICs Those who are about to engage in circuit design, etc. ● Agenda 1. What is an Operational Amplifier - What is an operational amplifier - What is an ideal operational amplifier - Application circuits of operational amplifiers - Typical amplification circuits and gain 2. Structure of Operational Amplifiers 3. Classification of Operational Amplifiers - Dual power supply/single power supply/full swing input/output - High precision/high speed/broadband/high output/low noise/low consumption We look forward to your participation!

Jan 09, 2026

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2026/05/22 ◆ Engineering Multivariate Analysis Seminar

  • NEW
  • SEMINAR_EVENT

Extracting essential information, data analysis for prediction, cause analysis, reduction, and classification: A Practical Introduction ~Multivariate Analysis Specialized for the Manufacturing Industry: Basics and Implementation Procedures/Know-how for Analytical Practice~ [Includes Software Distribution and PC Exercises] -------------------------------------------------- https://www.science-t.com/seminar/B260522.html ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━ We will inform you about upcoming technical seminars with discounted participation fees. If you would like to apply for each seminar with a discount, please contact ikuma.fukui@wmjplab.com. * The discount on participation fees is available to anyone. * However, we do not accept participation from technical consultants or instructors. * If you wish to have an in-house training session for the same seminar, please contact me directly. ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━

Jan 09, 2026

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March 25, 2026 ◆ Loss Function (JIS Z 8403) Seminar

  • NEW
  • SEMINAR_EVENT

Method for Determining Inspection Standards, Standard Values, and Safety Factors According to the Severity of Market Complaints ~ Fundamentals and Applications of Loss Functions that Balance Quality and Economic Efficiency ~ 【Includes PC Exercises (Templates that can also be used for in-house issue discussions)】 ------------------------------------------------------------ https://www.thplan.com/seminar/114398/ ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━ We will inform you about upcoming technical seminars with discounts on participation fees. If you would like to apply for each seminar with a discount on the participation fee, please contact ikuma.fukui@wmjplab.com. * The discount on the participation fee is available to anyone. * However, we do not accept participation from technical consultants or instructors. * If you wish to have the same seminar as an in-house training, please contact me directly. ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━

Jan 09, 2026

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2026/01/23 ◆ Engineering Artificial Intelligence Seminar

  • NEW
  • SEMINAR_EVENT

Introduction to Artificial Intelligence Application Development Led by Element Technologists Basics of Deep Neural Network Models and MT Systems, Minimization of Training Data, Development Implementation Procedures ~ Learning AI Application Know-How through "Automation of Development, Virtual Inspection, and Detection of Unknown Anomalies" ~ 【AI Construction Demo Included, Excel Materials on AI Construction and Calculation Methods Provided to Interested Parties】 ------------------------------------------------------------ https://johokiko.co.jp/seminar_chemical/AD260103.php ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━ We will inform you about upcoming technical seminars with discounted participation fees. If you would like to apply for each seminar with a discount, please contact ikuma.fukui@wmjplab.com. * The discount on participation fees is available to anyone. * However, we do not accept applications from technical consultants or instructors. * If you wish to have an in-house training session for the same seminar, please contact me directly. ━━━━━━━━━━━━━━━━━━━━━━━━━━━━━

Jan 09, 2026

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