FXE 160 nano

Our FXE X-ray source is equipped with high optical magnification and provides the best resolution due to the short distance between the X-ray source and the inspection target.
It is ideal for non-destructive testing for quality control, offline inspections, and measuring defects ranging from a few millimeters to 0.6 μm.
Thanks to Comet's proven technology, stable operation at 160 kV is guaranteed, enabling the inspection of complex multi-layer components.
We look forward to your inquiries and downloading our materials.

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