It is a crystal wafer surface property inspection device from Okhit Materials System Corporation.
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basic information
【Features】 ○ It is possible to measure the surface somark, step height, and thickness deviation of quartz wafers after wire cutting. ○ It is also possible to distinguish between X-axis and Z-axis products of quartz wafers and blanks. ○ Measurement of the grain orientation of Lambert processed products is also possible. ● For more details, please contact us or download the catalog.
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Company information
Our company has established a fundamental philosophy of "aiming to revive Japan's industrial strength by liberating ourselves from the shackles of capital investment through innovative technology." We were founded in 2003, deliberately during the depths of Japan's economic downturn, and have been engaged in unique material, processing, and surface treatment technologies, focusing on the manufacturing processes and molds for crystal devices based on industry-academia-government collaboration in research and development. Today, we are expanding our development not only in the fields of crystals and molds but also into glass, MEMS, semiconductors, and other electronic materials, focusing on challenging process technologies. While we are assembling functional products from synergistic partner companies, we are also engaged in consulting and research and development projects across a wide range of technological fields. As the economic environment becomes increasingly severe, we will strive even harder to ensure that our technologies, which consider not only technical solutions but also investment amounts and environmental factors, continue to gain your support.