A clear explanation of the actual analysis of microscopic foreign substances in polymer materials using real samples!
【Lecturer】 Dr. Toshikatsu Nishioka, Part-time Lecturer at Gunma University Graduate School (Ph.D. in Engineering, University of Tokyo) 【Venue】 Educational and Cultural Center, Room 1 【Kawasaki Station, Kanagawa】 【Date and Time】 December 15, 2010 (Wednesday) 10:30 AM - 4:00 PM
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basic information
【Program】 1. Overview of analytical instruments used for foreign substance analysis 1.1. Microscopic FT-IR 1.2. Microscopic Raman 1.3. Other instruments 2. Techniques for sample pretreatment methods 2.1. Pretreatment equipment 2.2. Pretreatment tools 2.3. Methods for collecting foreign substances 3. Techniques for analysis using microscopic infrared spectroscopy 4. Techniques for analysis using microscopic Raman spectroscopy 5. Techniques for analysis using X-ray microanalyzers 6. Techniques for analysis using other analytical instruments 7. Examples of analysis and interpretation of actual samples 7.1. Analysis of microscopic foreign substances in molded polymer materials 7.2. Analysis of microscopic foreign substances in automotive materials 7.3. Analysis of microscopic foreign substances in electrical, electronic, and optoelectronic materials 8. Techniques for elucidating the causes of foreign substance generation and approaches to manufacturing sites 9. Consultation session regarding foreign substance analysis 【Q&A and Business Card Exchange】
Price information
New members who apply for the first time by December 3rd will receive an early bird discount price of 39,900 yen.
Price range
P2
Delivery Time
P2
※Delivery schedule for the course ticket
Applications/Examples of results
【Course Overview】 In various industrial materials such as electrical and electronic materials, optoelectronic materials, automotive materials, and packaging materials, the contamination of microscopic foreign substances can pose quality issues and sometimes lead to fatal defects in practical applications. The development of analytical methods for microscopic foreign substances in polymer materials is one of the important challenges for solving problems related to the manufacturing and use of materials. Techniques such as microscopic FT-IR, microscopic Raman, SEM-XMA, TOF-SIMS, X-ray microdiffractometer, micro XPS, scanning Auger electron microscopy, and micro MS are used for the analysis of microscopic foreign substances, with microscopic FT-IR and microscopic Raman being particularly effective tools for the qualitative analysis of organic microscopic foreign substances. This course will provide a clear explanation of the practical analysis of microscopic foreign substances in polymer materials using actual samples. It will also detail the know-how for sample pretreatment and offer consultation on analysis.
Company information
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