[Analysis Case] Evaluation of the Interface between the Alq3 Layer and the Emission Layer of Organic EL Devices
Degradation assessment by depth profiling using TOF-SIMS.
As a result of performing pre-treatment to depth direction analysis without exposing the organic layer of the degraded brightness element to the atmosphere, diffusion was observed at the Alq3/emission layer interface in the samples after applying voltage. Similar results were obtained from both Slope Mapping (Figure 1) and depth direction analysis using ion sputtering (Figure 2).
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