40μm Z-range extension head. AFM head for rough shape applications.
We have developed a new type of MFP-3D extension head for use with the MFP-3D atomic force microscope (AFM/SPM) system. It provides a range of 40 μm in the Z direction for imaging tall samples and long-range force measurements, minimizing degradation of imaging performance (atomic resolution can also be achieved).
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basic information
【Features】 ○ Capable of scanning up to a height of 40μm! ○ Utilizes a nano-position sensing system sensor ○ Overwhelmingly low noise! ○ Can be retrofitted to your existing standard head ● For other functions and details, please contact us.
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Oxford Instruments, independent from the University of Oxford in the UK, has had innovation as the driving force behind its growth and success for over 60 years. Our core technologies are utilized in a wide range of applications, including next-generation semiconductors, new-generation communications, advanced materials, healthcare, life sciences, quantum technology, and space science, contributing to various projects aimed at achieving a greener world sooner.