AFM/SPM calibration standards and standard samples for calibrating AFM.
The CalibratAR calibration reference can be used for various purposes such as the evaluation and calibration of diverse microscopes. Its applications range widely, including scanning probe microscopes, atomic force microscopes, electron microscopes, optical microscopes, and even stylus and optical profilers. For three-dimensional evaluation, the reference sample design incorporates shapes in three orthogonal directions.
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Oxford Instruments, independent from the University of Oxford in the UK, has had innovation as the driving force behind its growth and success for over 60 years. Our core technologies are utilized in a wide range of applications, including next-generation semiconductors, new-generation communications, advanced materials, healthcare, life sciences, quantum technology, and space science, contributing to various projects aimed at achieving a greener world sooner.