Semiconductor industry (visual inspection)
This is a device that creates mapping data using a line camera after setting the wafer chips on the XYθ stage, and then simultaneously inspects multiple chips with a high-resolution area camera.
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basic information
【Features】 ○ Simultaneous inspection of multiple chips ○ Detailed settings can be specified by defining the acceptable range in color space ○ Variety switching can be handled by software ○ Inspection results can be output to a file (MAP file) ○ MAP file input is possible (can overwrite inspection results) ○ Magnification change is possible by using a microscope objective lens ※ Possible magnification: 2x to 100x ● For other functions and details, please contact us.
Price information
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Delivery Time
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Applications/Examples of results
【Purpose】 ○Inspection Items ・Discoloration ・Foreign Objects ・Scratches ・Cracks ・Chips ●For other functions and details, please contact us.
Company information
Okano Electric has upheld the philosophy of "meeting customer expectations through the power of technology" since its founding, walking alongside our customers. We will continue to accurately respond to customer needs and strive to provide consistently high-quality products, while also working to further enhance our technological capabilities. Additionally, we are committed to contributing to society by supporting the development of our customers. Okano Electric aims to be a company that lasts for 100 years and will continue to make strides in the next 50 years as well.