APD (Amplitude Probability) Distribution Measurement Device - Measurement of Electric and Magnetic Field Distribution using APD -
Noise that could not be captured by the spectrum analyzer is now observable.
APD (Amplitude Probability Distribution) is a statistical method that illustrates the relationship between power level and time frequency in a single graph derived from the time waveform of a signal. This measuring instrument calculates both the strength and probability of noise by measuring the time variation of noise in terms of bandwidth and time at high frequencies used in wireless communication. ● Features - Capable of observing high-order harmonic components and modulated noise. - By accurately securing the observation time, it allows for measurements of modulated waves and burst waves without omissions. - Provides measurements that correlate well with the evaluation of digital wireless communication (BER: Bit Error Rate). ■ Device Features - Measurement of electric and magnetic field distribution using APD. - The measurement area is shielded to cut unwanted external noise. - Equipped with simultaneous electric and magnetic field sensors. - Features height detection for the object being measured, making it easy to measure uneven surfaces. - Electric and magnetic field distribution measurement via spectrum. - Easy-to-understand three-dimensional display software with a stereoscopic representation. - Measurement range alignment is facilitated by a teaching box. - Utilizes a proprietary signal analysis device.
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It is an effective device for inspection and research on noise issues within machinery.
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Peritech derives its name from "peripheral" and "technology," and we are proposing unique technology research and development in T&M (measurement systems and testing equipment) to everyone. We hope to be of service as your peripheral devices. At Peritech, we utilize 'LabVIEW,' a graphical programming language specialized for measurement and testing, to conduct technology research and development and proposals for T&M (measurement systems and testing machines). Since our founding, we have carried out a diverse range of developments, totaling over 4,000 projects. We provide high-performance, low-cost, and compact T&M systems such as RFID testers, ECU testers, and IC testers. We have been certified as a platinum alliance partner, ranking at the top among partner companies of National Instruments (NI), the sole developer of LabVIEW in Japan, and we maintain a strong trust relationship with NI. This enables us to provide the best development consulting to our customers. Moving forward, Peritech will continue to offer comprehensive and high-quality solutions leveraging the latest LabVIEW technology to support the growth of many customers.