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  6. EMI Tester EMI-100/200 - Electromagnetic Wave Noise Analysis/Measurement -

EMI Tester EMI-100/200 - Electromagnetic Wave Noise Analysis/Measurement -

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last updated:Jan 08, 2021

ペリテック 神奈川エンジニアリングセンター、東京営業所、ベトナム事業所
ペリテック 神奈川エンジニアリングセンター、東京営業所、ベトナム事業所
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How far can you identify the source of electromagnetic noise?

1. The world's only! Simultaneous detection and continuous measurement of nearby electric and magnetic fields (EMV-200) 2. Capable of high-sensitivity and high-resolution measurements 3. Realization of magnetic field measurement independent of wiring direction through probe rotation 4. Multifunctional measurement result display 5. High-precision probe movement mechanism 6. Convenient features 7. Various probes can be used 8. Proven track record in many companies ● The EMI tester automatically measures the noise distribution of electric and magnetic fields generated by electronic devices with high precision. ● The high-precision movable table automatically traces the shape of complex bumps and dips on PCBs and ICs, measuring with high sensitivity. ● The measured data is visualized with a variety of 3D graphics. (Dedicated analysis software is included.)

    Other electronic measuring instrumentsEMC TestingCircuit Board Inspection Equipment
EMITester.png

EMI Tester EMI-100/200 - Electromagnetic Wave Noise Analysis/Measurement -

EMITester.png
EMITester.png
  • Related Link - http://www.peritec.co.jp/product/emi.html

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basic information

EMI Tester Basic Information ■Features - APD (Amplitude Probability Distribution) function - Phase measurement function - Real-time spectrum analyzer function - Compliant with IEC61967-3 (Semiconductor EMI measurement method) - Simultaneous measurement of the vector distribution of nearby electric and magnetic fields - Capable of measurements at high frequencies exceeding 1GHz (up to 6GHz) - High spatial resolution with a small sensor (approximately <1mm) - Display of intensity distribution in 2D, 3D, and 4D (3D image of components plus color) - Minimum setting value: 1μm, repeatability accuracy: 50μm, employing a probe movement mechanism with sufficient accuracy for nearby magnetic field measurements - The probe automatically moves to the measurement position indicated on the measurement result map - A laser marker displays the indicated measurement position on the measurement result map (EMV-200) - Simple teaching with a laser marker is possible (EMV-200) This device has been adopted by many domestic and international companies manufacturing mobile phones, automotive components, noise countermeasure parts, PCs, and office automation equipment, with approximately 100 units in use.

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Applications/Examples of results

The EMI tester automatically measures the noise distribution of electric and magnetic fields generated by electronic devices with high precision. The high-precision movable table automatically traces the shape of complex bumps and irregularities on PCBs and ICs, allowing for highly sensitive measurements. The measured data is visualized with a variety of 3D graphics. (Dedicated analysis software is included.)

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Model number overview
EMV200
EMV100

catalog(17)

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EMI Tester EMV100-200 Brochure

EMI Tester EMV100-200 Brochure

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Introduction to Electric Field Probes

Introduction to Electric Field Probes

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Overview of Electromagnetic Field Measurement by EMI Tester

Overview of Electromagnetic Field Measurement by EMI Tester

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Nearby Electromagnetic Field Measurement Service

Nearby Electromagnetic Field Measurement Service

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Development of a near-field electromagnetic field measurement system that enables the estimation of distant electromagnetic fields.

Development of a near-field electromagnetic field measurement system that enables the estimation of distant electromagnetic fields.

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Features of Peritec's EMI Tester

Features of Peritec's EMI Tester

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EMI TESTER (English)

EMI TESTER (English)

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Introduction of EMI Tester EMV100/EMV200

Introduction of EMI Tester EMV100/EMV200

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Multi-channel integrated EMC measurement system

Multi-channel integrated EMC measurement system

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Peritec EMI Tester Solution

Peritec EMI Tester Solution

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Microstrip line (MSL)

Microstrip line (MSL)

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EMI Tester Rental Service

EMI Tester Rental Service

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EMI analysis solution

EMI analysis solution

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EMI Tester EMV100-200 / RF Noise Measurement System EMI360

EMI Tester EMV100-200 / RF Noise Measurement System EMI360

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Electric and magnetic field probe

Electric and magnetic field probe

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[For EMI Tester (LMV Series) Users] Subscription Service for Analysis Software

[For EMI Tester (LMV Series) Users] Subscription Service for Analysis Software

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Advanced near-field electromagnetic field measurement using RIGOL DSA875-TG and Peritec EMI tester.

Advanced near-field electromagnetic field measurement using RIGOL DSA875-TG and Peritec EMI tester.

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Exhibition at TECHNO-FRONTIER 2023

TECHNO-FRONTIER 2023 Exhibition

  • Seminar・Event

Peritec Co., Ltd. will be exhibiting at the "38th Power System Exhibition" of the TECHNO-FRONTIER 2023 trade show, at the Rigol Japan booth (booth number: 3F-25). Exhibition Dates: In-person Exhibition: July 26 (Wednesday) to July 28 (Friday), 2023, 10:00 AM to 5:00 PM Online Exhibition: August 1 (Tuesday) 10:00 AM to August 25 (Friday) 5:00 PM Venue: Tokyo Big Sight, East Exhibition Hall Attendance requires prior registration Cost: Free admission, paid seminars Peritec Exhibit: EMI Tester EMV-100

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Company information

ペリテック

ペリテック 神奈川エンジニアリングセンター、東京営業所、ベトナム事業所

Testing, Analysis and Measurement

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Peritech derives its name from "peripheral" and "technology," and we are proposing unique technology research and development in T&M (measurement systems and testing equipment) to everyone. We hope to be of service as your peripheral devices. At Peritech, we utilize 'LabVIEW,' a graphical programming language specialized for measurement and testing, to conduct technology research and development and proposals for T&M (measurement systems and testing machines). Since our founding, we have carried out a diverse range of developments, totaling over 4,000 projects. We provide high-performance, low-cost, and compact T&M systems such as RFID testers, ECU testers, and IC testers. We have been certified as a platinum alliance partner, ranking at the top among partner companies of National Instruments (NI), the sole developer of LabVIEW in Japan, and we maintain a strong trust relationship with NI. This enables us to provide the best development consulting to our customers. Moving forward, Peritech will continue to offer comprehensive and high-quality solutions leveraging the latest LabVIEW technology to support the growth of many customers.

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