Standard device for optical path difference of various types of distortion gauges.
A series of phase difference plates arranged in order. By simply aligning them with the sample using various strain gauges, the strain amount can be determined. They can also be used as calibration standards for various strain gauges.
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basic information
【Product Features】 ○ Quantitative measurement is easy for anyone to perform by comparing with the strain in the sample. ○ The sensitive color plate method allows for observation of gradual color changes. ○ Calibration certificates can be issued as reference instruments for the Senaromon method and Babine compensator method. ○ An optional standard instrument for specified optical path difference can be created. 【Product Specifications】 Measurement Range: 0-230nm Measurement Accuracy: ±5nm Element: Film type Dimensions: 45*210mm * Please specify the calibration certificate at the time of order. * For specified optical path differences, a separate estimate will be provided. The specified optical path difference must be at least 10nm apart. ● For more details, please contact us by phone or email.
Price information
Market price: 50,000 yen. If a specific optical path difference is required, a separate estimate will be provided.
Price range
P2
Delivery Time
P3
Applications/Examples of results
You can determine the strain amount simply by placing the sample alongside various strain gauges. They can also be used as calibration standards for various strain gauges.
Company information
We manufacture various measuring instruments and testing devices. While effectively incorporating technologies from different fields, from our own products to OEM products, we respond to our customers' needs. Distortion testers, surface stress meters, linear expansion coefficient measuring devices, automatic coating devices, tabletop hot presses, friction fastness testing devices, and other various measurement and inspection systems.
