"PS-100-S7Z45D" is an image with no loss due to specular reflection from external illumination.
The external illumination captures the specular reflection image. As a result, the color of the workpiece is lost, but all factors that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The moving image shown below is a comparative image captured with the halation microscope "PS-100-S7Z45D" (medium magnification) for flat observation, using halation lighting and incident lighting on a metal painted surface. The image under incident lighting makes it difficult to capture scratches, while the image under halation lighting does not capture color but clearly reveals the scratches.
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basic information
Haleation Microscope "PS-100-S7Z45D" Standard Edition (Medium Magnification) is designed for flat haleation observation with the capability of light curved surfaces (50x to 300x on a 15" monitor, up to 4 microns). It features a telecentric zoom lens that allows observation at zoom magnifications of 0.75x to 4.5x and high-brightness haleation illumination, achieving high-quality images and maintaining the highest standards as a microscope for "seeing the unseen." It is an extremely versatile microscope that allows for easy identification of targets through zooming in for magnified observation. 【Features of the Haleation Microscope】 ○ Images can be obtained without loss due to direct reflection from external illumination. ○ Reflection images with minimal angles can be obtained, allowing for the confirmation of surface protrusions. ○ It is capable of observing haleation images on light curved surfaces (convex φ80 or more in the X direction). ○ Can be used as a simple incident illumination microscope. ○ Can be utilized as a simple dark field illumination. ● For more details, please contact us or download the catalog.
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Applications/Examples of results
【Applications】 ○ Inspection of ITO for EL and LCD, observable even in the encapsulated state of liquid crystals, spacer distribution inspection ○ Detection of cracks, scratches, and dirt on IC chips down to 4 microns ○ Detection of mirror finishes, foreign objects, scratches, and pinholes down to 4 microns ○ Inspection of foreign objects, scratches, dirt, and watermarks on glass, plastic, metal, etc. ○ Inspection of pinholes, delamination, and scratches in thin films, vapor deposition, coatings, etc. ○ Inspection of BGA, ceramics, rubber-based materials, etc., after mounting ● For more details, please contact us or download the catalog.
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Company information
With the advancement of ultra-precision machining technology, there is a demand for equipment with high observation capabilities in a wide range of fields, including electronic components with extreme precision and academic fields in biology that explore minute structures. The halation microscope, which utilizes optical illumination, is the ideal instrument for investigating fine structures across various industries. Sees International is integrated with development and design technologies related to halation microscopes, and is prepared to promptly respond to your technical needs for horizontal deployment, meeting your expectations in inspection, observation, and research tasks.
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