Since it is a specular reflection image due to external illumination, an image without loss can be obtained.
The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all factors that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left shows a comparative image of dirt on an IC chip captured using the "PS-100-S6Z90A" halation microscope for planar observation (high magnification) with halation lighting and reflected lighting. The image taken with reflected lighting does not capture the dirt, while the image taken with halation lighting clearly shows the dirt.
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basic information
The Halation Microscope "PS-100-S6Z90A" is designed for high-magnification surface observation (100x to 600x on a 15" monitor, down to 2 microns). It features a telecentric zoom lens that allows observation at 600x (on a 15" monitor) and halation lighting to achieve high magnification and high-quality images. This microscope, designed for surface observation to "see the unseen," is equipped with a height reading dial. With a zoom range of 100x to 600x, it can observe particles down to 2 microns and is particularly effective for detecting scratches and cracks, making it an extremely versatile video microscope. The use of high-brightness power LEDs for illumination has improved the observation of difficult-to-reflect areas. **Features of the Halation Microscope:** - Images can be obtained without loss due to direct reflection from external illumination. - Reflection images with minimal angles allow for confirmation of surface protrusions. - The BXFM is used for Z-axis fine adjustment, enabling depth measurement. - There is no lighting between the workpiece and the camera, eliminating the effects of lighting leaks within the lens, resulting in clear images. - Due to the minimal angle, image tilt distortion (0.24%) can be ignored. For more details, please contact us or download the catalog.
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Applications/Examples of results
【Applications】 ○ Inspection of ITO for EL and LCD, observable even in the encapsulated state of liquid crystals, ACF inspection after electrode pressure bonding, etc. ○ Detection of cracks, scratches, and dirt on IC chips down to 2 microns. ○ Detection of mirror finish, foreign substances, scratches, and pinholes down to 2 microns. ○ Inspection of foreign substances, scratches, cracks, and dirt on glass and plastic. ○ Inspection of pinholes, peeling, and scratches in thin films, vapor deposition, and coatings. ○ Inspection of scratches, foreign substances, and whiskers on ferrules. ● For more details, please contact us or download the catalog.
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Company information
With the advancement of ultra-precision machining technology, there is a demand for equipment with high observation capabilities in a wide range of fields, including electronic components with extreme precision and academic fields in biology that explore minute structures. The halation microscope, which utilizes optical illumination, is the ideal instrument for investigating fine structures across various industries. Sees International is integrated with development and design technologies related to halation microscopes, and is prepared to promptly respond to your technical needs for horizontal deployment, meeting your expectations in inspection, observation, and research tasks.
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