Since it is a specular reflection image due to external illumination, an image without loss can be obtained.
The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all elements that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left is a comparative image taken with the high-magnification halation microscope "PS-100-S7Z90A" for planar observation, capturing the ITO and spacers of the LCD using halation lighting and incident lighting. The image captured with incident lighting does not show the ITO, while the image captured with halation lighting clearly recognizes both the ITO and the spacers.
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basic information
The Halation Microscope "PS-100-S7Z90A" is designed for high-magnification surface observation (100x to 600x on a 15" monitor, down to 2 microns). It features a telecentric zoom lens that allows observation at 600x (on a 15" monitor) and halation illumination, achieving high magnification and high-quality images, maintaining its status as the best microscope for observing "invisible things." With a zoom range of 100x to 600x, it can observe particles down to 2 microns and is particularly effective for detecting scratches and cracks, making it an extremely versatile microscope. High-brightness illumination has been provided to enhance its versatility. **Features of the Halation Microscope:** - Provides lossless images due to the direct reflection image from external illumination. - Allows confirmation of surface protrusions with the acquisition of reflection images at very small angles. - The illumination is close to the workpiece, requiring less light and minimizing its impact on the workpiece. - There is no illumination between the workpiece and the camera, eliminating the effects of light leakage within the lens, resulting in clear images. For more details, please contact us or download the catalog.
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Applications/Examples of results
【Applications】 ○ Inspection of ITO edge details of EL and LCD, observable even in the encapsulated state of liquid crystals, and FPC inspection after electrode pressure bonding. ○ Detection of cracks, scratches, and dirt on IC chips down to 2 microns. ○ Detection of mirror finish, foreign substances, scratches, and pinholes down to 2 microns. ○ Inspection of foreign substances, scratches, cracks, and dirt on glass and plastic. ○ Inspection of pinholes, delamination, and scratches on thin films, vapor deposition, and coatings. ○ Inspection of scratches, foreign substances, and whiskers on ferrules. ● For more details, please contact us or download the catalog.
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Company information
With the advancement of ultra-precision machining technology, there is a demand for equipment with high observation capabilities in a wide range of fields, including electronic components with extreme precision and academic fields in biology that explore minute structures. The halation microscope, which utilizes optical illumination, is the ideal instrument for investigating fine structures across various industries. Sees International is integrated with development and design technologies related to halation microscopes, and is prepared to promptly respond to your technical needs for horizontal deployment, meeting your expectations in inspection, observation, and research tasks.
