It comes with a height reading dial, allowing for depth measurement as well, making it highly versatile.
The external illumination captures the specular reflection image. As a result, the color of the workpiece disappears, but all elements that hinder reflection, such as scratches, dents, cracks, and dirt, can be observed as shadows in the image. A reflection image with a small angle can be obtained, allowing for the confirmation of the surface's raised condition. The image on the left is a comparative image captured using the halation microscope "PS-100-S6Z45C" (medium magnification) for planar observation, showing the ITO of the LCD under halation lighting and incident lighting. The image under incident lighting does not show the ITO, while the image under halation lighting clearly reveals the ITO.
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basic information
The Halation Microscope "PS-100-S6Z45C" Standard Edition (Medium Magnification) is designed for planar halation observation (50x to 300x on a 15" monitor, down to 4 microns). It achieves high-quality images with a telecentric zoom lens that allows observation at 300x (on a 15" monitor) and halation illumination, making it a microscope for observing surfaces to "see the unseen." It now comes with a height reading dial. With a zoom range of 50x to 300x, it allows for easy identification of targets through magnified observation and also enables depth measurement, making it an extremely versatile microscope. **Features of the Halation Microscope:** - Images can be obtained without loss due to direct reflection from external illumination. - Reflection images with minimal angles can be obtained, allowing confirmation of surface protrusions. - Since the illumination is close to the workpiece, less light is required, minimizing its impact on the workpiece. - There is no illumination between the workpiece and the camera, eliminating the effects of light leakage within the lens, resulting in clear images. - The minimal angle allows for neglecting image tilt distortion. For more details, please contact us or download the catalog.
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Applications/Examples of results
【Applications】 ○ Inspection of ITO for EL and LCD, observable even in the encapsulated state of liquid crystals, spacer distribution inspection ○ Detection of cracks, scratches, and dirt on IC chips down to 5 microns ○ Detection of mirror-finish paint, foreign objects, scratches, and pinholes down to 5 microns ○ Inspection of foreign objects, scratches, and dirt on glass, plastic, etc. ○ Inspection of pinholes, peeling, and scratches in thin films, vapor deposition, and coatings ● For more details, please contact us or download the catalog.
Company information
With the advancement of ultra-precision machining technology, there is a demand for equipment with high observation capabilities in a wide range of fields, including electronic components with extreme precision and academic fields in biology that explore minute structures. The halation microscope, which utilizes optical illumination, is the ideal instrument for investigating fine structures across various industries. Sees International is integrated with development and design technologies related to halation microscopes, and is prepared to promptly respond to your technical needs for horizontal deployment, meeting your expectations in inspection, observation, and research tasks.
