Haleration Microscope "PS..S7Z16R100-2"

With its unique lighting effect, it has become possible to observe curved and R surfaces.

The halation lighting system utilizing specular reflection allows for the capture of images of cracks, scratches, and dirt that are difficult to see with conventional incident lighting, achieving outstanding high-resolution images. Since a reflection image with a small angle can be obtained, it is now possible to observe surface irregularities "more easily," "more reliably," and "more quickly" than before, significantly simplifying tasks such as quality inspection. This is the optimal model for curved surface observation and will help resolve issues related to observing R surfaces. The image on the left is a comparison captured by the halation microscope "PS-100-S7Z16R100-2" for curved surface observation, showing scratches and mold on the lens surface using both halation and incident lighting. The incident lighting image captures only a small part of the scratches on the lens, while the halation lighting image clearly captures both the scratches and the mold.

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