Microscope-type non-contact height/step/thickness measuring instrument compatible with 300mmφ wafers.
High-precision measurements can be performed semi-automatically with image detection of the target's left and right lines and automatic control of the Z-axis. For more details, please download the catalog or contact us.
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【Features】 ○ This is a microscope-type non-contact height/step/thickness measurement device compatible with 300mmφ wafers. ○ It enables semi-automatic high-precision measurement through image detection of the left and right lines of the target and automatic control of the Z-axis. ● You can view detailed specifications and other information by downloading the catalog. If you are interested, please download and check the catalog.
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We will collaboratively think about and manufacture prototypes, automatic machines, and online machines for inspection equipment that supports the manufacturing and development of new technologies, tailored to your ideas and requests. We provide everything from the design and manufacturing maintenance of hardware, optical systems, and software for ordered products to after-sales service.