Precise temporary fixation of glass samples, films, and silicon substrates!
The MA series sample alignment temporary fixing device is a sample alignment device that aligns and adheres two samples, such as films, glass, silicon, and metals with microstructures on their surfaces, with high precision. The two samples are arranged vertically, and the lower sample is aligned in the XYZ∂ axis direction relative to the upper sample, which serves as a fixed reference. Various types of alignment microscopes are available, including eyepiece types, CCD camera and monitor observation types, variable magnification types, and infrared observation types. An image freeze system that allows alignment even with gaps exceeding the microscope's depth of focus is also supported. The sample mounting section accommodates various sample sizes, and holders made of Pyrex glass for fragile samples like films, as well as sample holders with spacers for degassing in an anodic bonding device chamber, can also be manufactured. For more details, please contact us or refer to the catalog.
Inquire About This Product
basic information
【Features】 ○ Precise temporary fixation of glass samples or films to silicon substrates ○ Functionality to align two samples with high precision and bring them into close contact → Films, glass, silicon, metals, etc., with microstructures on the surface ○ Arrangement of two samples vertically, aligning the lower sample in the XYZ∂ axis direction relative to the upper sample as a fixed reference ○ Various types of alignment microscopes are available → Eyepiece type → CCD camera and monitor observation type → Variable magnification type, infrared observation type, etc. ○ Alignment is possible even with gaps exceeding the microscope's depth of focus → Image freeze system is also supported ○ Sample mounting section accommodates various sample sizes ○ Pyrex glass holder for fragile samples such as films ○ Sample holders with spacers can also be manufactured → Suitable for degassing within the anode bonding device chamber 【Specifications】 ○ Maximum sample size: ¢6 inches (for both upper and lower) t=approximately 2mm ○ Method for attaching and detaching upper and lower samples: Manual installation and removal ○ Support for upper and lower samples: Vacuum suction fixation ○ Temporary fixation of samples: Mechanical clamp temporary fixation or adhesive fixation ● For more details, please contact us or refer to the catalog.
Price information
Please contact us.
Delivery Time
※Please contact us.
Applications/Examples of results
For more details, please contact us or refer to the catalog.
catalog(1)
Download All CatalogsCompany information
For inquiries regarding MEMS micromachine-related development tools, please contact us.