This is a collection of case studies on the composition evaluation, identification, film thickness evaluation, shape evaluation, and crystal structure evaluation of solar cells (PV). The content was also exhibited at the International Solar Cell Exhibition.
For those who could not attend the PV EXPO 2013 (International Photovoltaic Exhibition) or visit the MST booth, and for those who would like to view MST's exhibition materials again, please take a look. We are introducing all six panels of materials used at the exhibition 'PV EXPO 2013', where components, materials, equipment, cells, and modules necessary for the research, development, and manufacturing of solar cells were showcased. [Contents] We present examples of quantitative evaluations of the composition distribution of the active layer in organic thin-film solar cells and the concentration distribution of dopants directly beneath the electrodes. We also provide high-precision quantitative analysis of the composition of deposited CIGS thin films using ICP-MS, as well as various data such as analytical diagrams, structural diagrams, and schematic diagrams illustrating the heteroepitaxial junction between CIGS and CdS, making it easy to understand. ■ For more details, please download the catalog or contact us.
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【Exhibition Panel Details】 (Excerpt) ○ Evaluation of composition distribution in the active layer of organic thin-film solar cells → Pre-treatment and depth analysis under controlled atmosphere are possible → Measurement methods: TOF-SIMS; treatment under controlled atmosphere ○ Evaluation of diffusion layer in crystalline Si solar cells → Quantitative evaluation of dopants and distribution of carriers → Measurement methods: SIMS; SCM; polishing; disassembly ○ Composition distribution analysis of CIGS thin films → Quantitative analysis of thin film composition, in-plane distribution, and depth distribution is possible → Measurement methods: SIMS; ICP-MS; XRF; etching ○ Observation of heterojunction interface in CIGS thin-film solar cells → Evaluation of crystal structure of the high-resistance layer at the CdS/CIGS junction interface using ultra-high-resolution STEM → Measurement method: TEM ○ Comprehensive evaluation of Zn-based buffer layers using X-rays → Evaluation of composition, bonding state, structure, and density is possible → Measurement methods: XPS; XRD; XRR; polishing ● For more details, please download the catalog or contact us.
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Applications/Examples of results
【Applications】 ○ Composition evaluation ○ Identification ○ Composition distribution evaluation ○ Trace impurity concentration evaluation ○ Shape evaluation ○ Product investigation ○ Film thickness evaluation ○ Crystal structure evaluation ○ Chemical bonding state evaluation Others For more details, please contact us.
Company information
MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!