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  4. Inspection Equipment and Devices
  5. probe
  6. Wafer Fully Automatic High-Speed LED Chip Prober NPB-600A

Wafer Fully Automatic High-Speed LED Chip Prober NPB-600A

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last updated:Aug 02, 2013

ワイエイシイガーター
ワイエイシイガーター
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We have successfully adopted a unique measurement method that significantly improves production efficiency.

The NPB-600A is a device that inspects the optical and electrical characteristics, as well as the appearance images, of diced LED chips (elements). It performs all measurements and appearance inspections automatically, including wafer replacement. By adopting a unique measurement method, it has successfully significantly improved production efficiency, achieving a cycle time of Max 0.07 seconds per unit. For more details, please contact us or refer to the catalog.

    probe
01_NPB-600A.jpg

Wafer Fully Automatic High-Speed LED Chip Prober NPB-600A

01_NPB-600A.jpg
01_NPB-600A.jpg
  • Related Link - http://www.garter.co.jp/j/product/others.html#600A

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**Features** - Simultaneous measurement possible with three probe stages - Position and measurement range of LED chips stored based on image judgment results - Capable of determining chip damage, cracks, breaks, discoloration, etc., through top surface image processing functionality - Automatic wafer exchange and magazine storage after measurement **Specifications** - Cycle time: 0.07 seconds per unit (excluding test time) - Number of wafer rings: 3×12 pieces - Ring size: 5 to 10 inches - Probe holder: Max 7 sets - Probe pressure: 2 to 10g - CCD field of view: 3.6mm×4.8mm - CCD resolution: 1296×966 pixels - Lighting: Ring lighting (sequence control) - Power supply: AC200/220V 5A - Supply air: 0.5MPa - External dimensions: W2000×H1641×D1200 mm - Tester: Customer specified For more details, please contact us or refer to the catalog.

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Fully Automatic High-Speed LED Chip Prober NPB-600A

Fully Automatic High-Speed LED Chip Prober NPB-600A

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ワイエイシイガーター

ワイエイシイガーター

Electronic Components and Semiconductors

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"Globalization" symbolizes everything, as the electronic components and semiconductor industry has entered an era of international competition. In order to advance corporate activities amid increasingly fierce international competition, continuous corporate transformation becomes essential. Japan Garter Co., Ltd. places customer satisfaction at the core of its management and constantly aims for innovation in internal systems to develop and supply products that satisfy our customers. The technological and developmental capabilities accumulated since our founding are passed down as the DNA of Japan Garter Co., Ltd. We have been thinking collectively as an organization to achieve customer satisfaction, inspiring each other among employees, and striving for reform in our internal systems. The developer spirit that thrives within Japan Garter Co., Ltd. is at the core of this system development, and we believe it is our mission to quickly develop and create unique products and services ahead of everything else to respond to the diversification of customer demands.

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