In-Circuit Test System "i3070"

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last updated：Dec 03, 2013

協立テストシステム

Official site

An in-circuit test system characterized by easy operability through a GUI.

The Agilent Medalist i3070 is the latest in-circuit test system that combines the high flexibility of the widely used 3070 series with the advanced graphical user interface of the i5000. It is equipped with new features that enhance test throughput and test coverage, enabling further efficiency in board inspection. 【Features】 ○ Easy operability through GUI ○ High test throughput ○ Highly flexible system architecture ○ Compatibility with existing systems For more details, please contact us or download the catalog.

Related Link - http://www.testsystem.co.jp/jp/index.htm

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basic information

【Main Features】 ○ Automatic Debugging Function (AutoDebug) ○ Automatic Optimization Function (AutoOptimizer) ○ VTEP v2.0 Vectorless Test Technology 【Characteristics】 ○ Supports the efficiency of test development ○ Achieves reduced measurement time for analog in-circuit testing ○ Configurations with varying maximum pin counts from 1 module to 4 modules are possible ○ Compatible with existing 3070 and i5000 fixtures and test programs ● For more details, please contact us or download the catalog.