In-Circuit Test System "i1000D"

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last updated：Dec 03, 2013

協立テストシステム

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You can easily conduct tests on digital devices at a low cost.

By using the Agilent Medalist i1000D In-Circuit Tester (ICT), you can easily and affordably test digital devices, achieving groundbreaking digital testing. 【Features】 ○ The Test Developer GUI is user-friendly, allowing even inexperienced users to create fixtures and programs in just a few days. ○ The graphical interface makes digital debugging simple. ○ Comes with the VTEP v2.0 Powered test suite. ○ Equipped with boundary scan test functionality. For more details, please contact us or download the catalog.

Related Link - http://www.testsystem.co.jp/jp/products/i1000D.htm

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【Features】 ○ Inherits all the user-friendly functions of the previous U9401/2A ○ Adds new features that facilitate the development/debugging of digital tests ○ Can prepare and execute fixtures/programs in just a few days ○ Allows for quick modifications to individual tests during debugging → Even inexperienced users can start using the system immediately ○ Can debug passive analog components without power with just one click of a button → Even users with limited ICT experience can debug analog tests in a few hours ○ AutoDebug allows for fine-tuning of tests, enabling reliable manufacturing tests → The typical debugging process that takes days can be completed in just a few hours ● For more details, please contact us or download the catalog.