Rotational Compensation Type Spectroscopic Ellipsometer 'SE-2000' *Seminar Held
SE-2000
High-precision measurement of the thickness and refractive index of multilayer films without contact. Easy operation of the main unit and analysis tasks. *Demonstration available and technical materials provided.
The "SE-2000" is a rotating compensator type spectroscopic ellipsometer that can measure the film thickness and refractive index of thin films with high precision in a "non-contact" manner. It is equipped with user-friendly analysis software, making the analysis process easy. It supports measurements across a wide wavelength range from deep ultraviolet to near-infrared. It also accommodates inspections related to material composition ratios, anisotropy, Mueller Matrix, degree of polarization resolution, reflectance/transmittance, dopant concentration, and retardation (R0, Rth), making it versatile for a wide range of applications. 【Features】 ■ High-precision CCD and high-resolution PMT equipped ■ Rich database of optical models ■ Various expansion options available ■ Numerous sales achievements 〈 Seminar Details 〉 ■ Theme: Explanation of the Procedure for Creating Analysis Models for Spectroscopic Ellipsometers - Beginner Level - ■ Dates and Times ・ April 22 (Thursday) 10:00 AM ・ May 13 (Thursday) 4:00 PM ■ Content Using a sample of a general structure, we will explain the procedure for creating analysis models. Explanation of analyses using effective medium approximation models, Cauchy models, and Tauc-Lorentz models. * Please check our company website (link below) for participation details.
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basic information
*Technical materials introducing measurement principles, measurement examples, and analysis processes are currently available. You can view them via "PDF Download." *Demonstrations can also be conducted. **About Spectroscopic Ellipsometry** In spectroscopic ellipsometry, appropriate optical models are applied to the measurement data (Δ, ψ) across the entire wavelength range for analysis. As a result of the analysis, the film thickness, refractive index, and extinction coefficient of each layer can be obtained. Film thickness can be measured from sub-nanometers and exhibits excellent reproducibility. It is widely used for inspecting the optical properties of multilayer thin films and materials. *For more details, please feel free to contact us.
Price information
The price may vary depending on specifications such as wavelength range, so please feel free to contact us.
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Applications/Examples of results
【Application Examples】 There are a very large number of achievements in areas such as semiconductors, displays, solar cells, bio-related fields, and nanotechnology. *We have a free catalog available. Please feel free to download it or contact us.*
Detailed information
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Spectroscopic Ellipsometer Measurement Principle Image Ellipsometry Measurement Principle Image
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Mapping measurement result image Mapping result image
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Company information
Semilab is a comprehensive measurement device manufacturer that supports research and manufacturing of cutting-edge technologies worldwide. We handle non-contact CV measurement devices, lifetime measurement devices, spectroscopic ellipsometers, photoluminescence, DLTS systems, sheet resistance measurement devices, nanoindenters, AFM, and more for the inspection of semiconductor wafers and devices. Please feel free to contact us for specifications and pricing of our devices.