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  2. Electronic Components and Semiconductors
  3. 日本セミラボ 新横浜本社
Electronic Components and Semiconductors
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日本セミラボ 新横浜本社

addressKanagawa/Kohoku-ku, Yokohama-shi/6th Floor, YS Building, 2-15-10 Shin-Yokohama
phone045-620-7960
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last updated:Aug 17, 2020
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  • Company information
  • Products/Services(37)
  • catalog(13)
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日本セミラボ Company Overview

Semilab is a comprehensive measurement device manufacturer that supports research and manufacturing of cutting-edge technologies worldwide.

Semilab is a comprehensive measurement device manufacturer that supports research and manufacturing of cutting-edge technologies worldwide. We handle non-contact CV measurement devices, lifetime measurement devices, spectroscopic ellipsometers, photoluminescence, DLTS systems, sheet resistance measurement devices, nanoindenters, AFM, and more for the inspection of semiconductor wafers and devices. Please feel free to contact us for specifications and pricing of our devices.

Business Activities

■Import and sales of semiconductor measurement devices and provision of technical services ■We handle the following products: Spectroscopic Ellipsometer Non-contact Sheet Resistance Measurement Device DLTS Measurement System Nano Indenter AFM (Atomic Force Microscope) Carrier Mobility Measurement Device Non-contact CV Measurement Device Lifetime Measurement Device Photoluminescence Please feel free to contact us for device specifications and pricing information.

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Products/Services (37)

Expansion Resistance Measurement Device "SRP-170/2100" product image
Expansion Resistance Measurement Device "SRP-170/2100"
Crystal Defect Inspection Device "EnVision" product image
Crystal Defect Inspection Device "EnVision"
Non-contact mobility measurement device "LEI-1610 Series" product image
Non-contact mobility measurement device "LEI-1610 Series"
Epi film thickness measurement device "EIR-2500" product image
Epi film thickness measurement device "EIR-2500"

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catalog(13)

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Expansion Resistance Measurement Device "SRP-170/2100"

Expansion Resistance Measurement Device "SRP-170/2100"

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Mercury probe CV/IV measurement device

Mercury probe CV/IV measurement device

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Non-contact CV measurement device

Non-contact CV measurement device

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Hall Effect Measurement Device PDL-1000

Hall Effect Measurement Device PDL-1000

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news(4)

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[WEB Seminar Announcement!] Explanation of the Procedure for Creating Analysis Models for Spectroscopic Ellipsometers [Nihon Semilab]

  • SEMINAR_EVENT

We will be holding a webinar. Details are as follows. If you are interested, please join us! --- **Theme: Explanation of the Procedure for Creating Analysis Models for Spectroscopic Ellipsometers - Beginner Level** ■ Date and Time May 13 (Thursday) 16:00 - ■ Content Using a sample with a general structure as an example, we will explain the procedure for creating analysis models. As a beginner level, we plan to explain analyses using the effective medium approximation model, Cauchy model, and Tauc-Lorentz model. *If you wish to participate, please contact us through the Japan Semilab Co., Ltd. website (https://www.semilab-j.jp/seminar/).*

May 06, 2021

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[WEB Seminar Announcement!] Explanation of the Procedure for Creating Analysis Models for Spectroscopic Ellipsometers [Japan Semilab]

  • SEMINAR_EVENT

We will be holding a webinar. The details are as follows. If you are interested, please join us! --- "Theme: Explanation of the Procedure for Creating Analysis Models for Spectroscopic Ellipsometers - Beginner Level" ■ Date and Time First session: April 22 (Thursday) 10:00 AM Second session: May 13 (Thursday) 4:00 PM ■ Content We will explain the procedure for creating analysis models using a sample of a general structure. As a beginner level, we plan to explain analyses using the effective medium approximation model, Cauchy model, and Tauc-Lorentz model. *If you wish to participate, please contact us through the Japan Semilab website (https://www.semilab-j.jp/seminar/).

Mar 22, 2021

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Japan Semi Lab Web Seminar

  • SEMINAR_EVENT

"Theme: Explanation of the Procedure for Creating Analysis Models for Spectroscopic Ellipsometry - Beginner's Edition" ■ Date and Time First Session: April 22 (Thursday) 10:00 AM Second Session: May 13 (Thursday) 4:00 PM ■ Content Using a sample of a general structure as an example, we will explain the procedure for creating analysis models. As a beginner's edition, we plan to explain analyses using the effective medium approximation model, Cauchy model, and Tauc-Lorentz model. *If you wish to participate, please contact us through the Japan Semilab Co., Ltd. website (https://www.semilab-j.jp/seminar/).

Mar 16, 2021

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Detailed information

Company name 日本セミラボ 新横浜本社
Contact addresspostalcode 222-0033 Kanagawa/ Kohoku-ku, Yokohama-shi/ 6th Floor, YS Building, 2-15-10 Shin-YokohamaView on map TEL:045-620-7960 FAX:045-476-2146
Key PartnersSemiconductor Solar cell Manufacturing companies such as FPD Research institutions
Industry Electronic Components and Semiconductors

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