Logic Detailed Structure Analysis Report, Transistor Characteristics Report
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【Table of Contents】 [Logic Detailed Structure Analysis Report] ○ Overview of Package and Die ○ Substrate and Isolation Analysis ○ Representative Peripheral Transistors ○ Metal and Dielectric ○ Contacts and Bias ○ Input and Output Transistors ○ SRAM (Minimum Cell Size 6T or 8T) ○ Material Analysis of Some Layers ○ Dimensions ○ Main Findings [Transistor Characteristics Report] ○ Threshold Voltage (Linear and Saturation) ○ Drive Current (IDSAT) ○ Leakage Current (Both Gate and Channel) ○ Subthreshold Slope ○ Transconductance ○ Punchthrough Voltage ○ Process Gain Factor ○ IDS vs. VGS Graph ○ IDS vs. VDS Graph ○ Reference Cross-Section and Imaging ● For more details, please contact us or download the catalog.
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