Preventing oxidation degradation during cutting processing under N2 atmosphere.
Organic EL devices are prone to degradation in the atmosphere, so processing under an N2 atmosphere is necessary. We present the measurement results of Alq3 for organic EL devices that were machined in an N2 atmosphere and left in the atmosphere for 30 minutes, compared to those that were not exposed to the atmosphere. When left in the atmosphere, there is a strong tendency for peaks associated with oxygen to appear in Alq3. In the N2 atmosphere, there is a strong tendency for the parent ions of Alq3 to be observed. By avoiding exposure to the atmosphere, results closer to the true state can be obtained.
Inquire About This Product
basic information
For detailed data, please refer to the catalog.
Price information
-
Delivery Time
Applications/Examples of results
This is an analysis of the display.
catalog（1）
Download All Catalogs![[Analysis Case] Evaluation of Layer Structure of Organic EL Device_C0088](https://image.mono.ipros.com/public/catalog/image/01/908/335671/IPROS34298703135671395676.jpeg?w=120&h=170)
Company information
MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!
![[Analysis Case] Electronic Structure and Local Structure Analysis of LIB Cathode Materials](https://image.mono.ipros.com/public/product/image/584/2000246076/IPROS8677863885721567848.jpg?w=280&h=280)
![[Analysis Case] Composite Evaluation of the Active Layer of SiC Power MOSFETs](https://image.mono.ipros.com/public/product/image/09e/2000245900/IPROS01886822553157078679.jpeg?w=280&h=280)
