Investigation of the causes of coating peeling and poor adhesion through TOF-SIMS analysis.
To investigate the delamination issue that occurred on the nickel plating over bronze, TOF-SIMS analysis was conducted. By forcibly delaminating the affected area and performing qualitative analysis with TOF-SIMS, siloxanes and potassium compounds (such as potassium chloride and potassium sulfate) were detected from the delamination surface. These components are believed to be the cause of the delamination.
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Analysis of LSI and memory.
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Download All Catalogs![[Analysis Case] Evaluation of Nickel Plating Peel-off Surface by TOF-SIMS_C0404](https://image.mono.ipros.com/public/catalog/image/01/693/335803/IPROS39812235752634442531.jpeg?w=120&h=170)
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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!