Wide-range non-contact (eddy current method) sheet resistance/resistivity multi-point measuring instrument
The "NC-80MAP" is a resistance measuring device that supports a wide range of measurements using multiple types of non-contact probes. The number and type of probes can be changed according to your requirements. It is also capable of multi-point measurements from an edge of 8mm. Additionally, due to its non-contact eddy current method, measurements can be taken without causing any damage. It can be customized in various ways according to customer requests. 【Features】 ■ Non-contact type ■ Semi-auto type ■ Multi-point measurement system *For more details, please contact us or download the catalog.
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【Measurement Specifications】 ■Measurement Targets ・Semiconductor and solar cell materials (silicon, polysilicon, SiC, etc.) ・New materials and functional materials (carbon nanotubes, DLC, graphene, silver nanowires, etc.) ・Conductive thin films (metal, ITO, etc.) ・Silicon-based epitaxial and ion-implanted samples ・Compound semiconductor-related (GaAs Epi, GaN Epi, InP, Ga, etc.) ・Others (please inquire) ■Measurement Size: 2 to 8 inches (optional: 12 inches) ■Measurement Range ・Resistivity: 1m to 200Ω·cm (total range for all probe types / for thickness of 500μm) ・Sheet Resistance: 10m to 3kΩ/sq (total range for all probe types) *For more details, please inquire or download the catalog.
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We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare.