Non-contact resistance tester "EC-80"

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last updated：Sep 05, 2016

ナプソン

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Compact and easy-to-use manual non-contact (eddy current method) resistance meter.

The EC-80 is a simple measuring device that allows for measurements by simply placing a sample between the probes. You can easily switch between resistivity and sheet resistance measurement modes. Additionally, measurement conditions can be easily set using the JOG dial. Since it has fixed probes, you will need to choose one type from several probe types before purchase. It can be customized in various ways according to customer requests. 【Features】 ■ Non-contact type ■ Manual type ■ Single-point measurement system *For more details, please contact us or download the catalog.

Related Link - http://www.napson.co.jp/products/noncontact/manual…

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【Measurement Specifications】 ■Measurement Targets 　・Semiconductor and solar cell materials (silicon, polysilicon, SiC, etc.) 　・New materials and functional materials (carbon nanotubes, DLC, graphene, 　　silver nanowires, etc.) 　・Conductive thin films (metal, ITO, etc.) 　・Silicon-based epitaxial and ion-implanted samples 　・Compound semiconductors (GaAs Epi, GaN Epi, InP, Ga, etc.) 　・Others (please inquire) ■Measurement Size: Up to 8 inches or up to 156×156mm ■Measurement Range 　・Resistivity: 1m to 200Ω/cm (total range for all probe types / for thickness of 500μm) 　・Sheet Resistance: 10m to 3kΩ/sq (total range for all probe types) *For more details, please inquire or download the catalog.