Customizable spread resistance meter
The "SRS-2010" is a spreading resistance measurement system using a two-probe method. It is capable of determining the resistivity distribution in the depth direction of the sample, the thickness of epitaxial layers, the depth of PN junctions, and the carrier concentration distribution. Analysis can be performed on areas of a few millimeters square, down to pattern areas of several hundred micrometers. The low efficiency is calculated from the measured spreading resistance using a calibration curve. It can be customized in various ways according to customer requests. 【Features】 ■ Two-probe method ■ Capable of analyzing pattern areas ■ Calculation of resistivity *For more details, please contact us or download the catalog.
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【Measurement Specifications】 ■Measurement Target: Semiconductor and solar cell materials (silicon, polysilicon, SiC, etc.) ■Measurement Size: Please inquire ■Measurement Range ・1 to 10E+9 (Ω) [Sheet Resistance] ・Applied Voltage: 10 (mV) Detection Current: 10 (pA) to 10 (mA) *For more details, please inquire or download the catalog.
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We respond to all needs related to resistivity/sheet resistance, providing high-precision and high-performance systems by leveraging the latest technology and extensive experience, from specification design to aftercare.