Beam diameter: 2 μm to 100 μm, wavelength: 400 to 1100 nm, beam diameter measurable, with M2 beam quality analysis function.
- Beam diameter: 2 μm to 100 μm - Wavelength: 400 to 1100 nm - Beam diameter measurement capability - M2 beam quality analysis function included - Beam divergence angle analysis function included - Image logging function included - Analysis function for temporal changes in beam pointing included LaseView is a high-performance, versatile laser beam profiler that operates on Windows. By utilizing commercially available CCD and CMOS cameras, it is easy to configure a highly cost-effective and practical beam measurement system. In the LaseView camera set series, the optimal camera is selected according to the specifications of the laser. Although it is a set, it can be widely used regardless of conditions such as the laser wavelength range, diameter, or pulse/CW. The LaseView camera set series allows for easy construction of a beam profile measurement system.
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basic information
- Beam diameter: 2 μm to 100 μm - Wavelength: 400 to 1100 nm - Beam diameter measurement capability - M2 beam quality analysis function included - Beam divergence angle analysis function included - Image logging function included - Analysis function for temporal changes in beam pointing included LaseView is a high-performance, versatile laser beam profiler that operates on Windows. By utilizing commercially available CCD and CMOS cameras, it is easy to configure a highly cost-effective and practical beam measurement system. In the LaseView camera set series, the optimal camera is selected according to the specifications of the laser. Although it is a set, it can be widely used regardless of conditions such as laser wavelength range, diameter, or pulse/CW. With the LaseView camera set series, you can easily build a beam profile measurement system.
Price information
For model number LaseView-CA-DUV-BE: Price / LaseView and camera set: ¥991,000 Price / Camera set only: ¥691,000
Price range
P4
Delivery Time
※4-6 weeks
Applications/Examples of results
Configuration of the beam measurement system
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