Xenon Continuous Light Source Atomic Absorption Analysis Device contrAA 800 Series

A single lamp can measure all elements! An innovative atomic absorption analysis device that visually confirms the effects of proximity lines.

This is a new atomic absorption analysis device that overturns the conventional concept of atomic absorption analysis equipment, developed for the first time in the world by Analytik Jena using the xenon continuous light source background correction method. It covers all wavelength ranges used in atomic absorption analysis with a single light source, and in frame measurements, it allows for a reduction in measurement time through sequential measurements. The high-resolution optical system enables visual confirmation and separation of nearby lines. The high-precision background correction function, unaffected by nearby line interference, has significantly improved the accuracy of measurement results. 【Features】 ■ Equipped with a high-resolution echelle spectrometer (0.002nm/200nm) ■ Multi-element sequential rapid measurement with xenon continuous light source/CCD detection ■ Expansion of the measurement concentration linear range through multi-wavelength measurement of the same element and dynamic mode ■ Enhanced analytical capabilities by utilizing not only atomic absorption lines but also molecular absorption lines ■ Detailed data analysis through 2D and 3D data display ■ Direct analysis of solid samples is possible (optional: solid sampler) ■ High reliability of data and excellent automation efficiency with an auto-sampler ■ Analytik Jena offers a unique 10-year warranty on the optical system.

Analytical Equipment and Devices