Electromagnetic Wave Analysis Software Poynting for Optics

basic information

- A simulator that adopts the FDTD method (※1), providing high computational accuracy and a wide range of applications. - It can use subgrids in addition to non-uniform grids, allowing for the flexible setting of fine grids in specific areas as needed, achieving efficient simulations while maintaining high computational accuracy. - It supports metal medium models in the optical wavelength range and can calculate phenomena such as surface plasmon enhancement (※2), which is important in near-field optical applications. - Equipped with various wave source models, it allows for the setting of parameters specific to the optical field, such as polarization, incident angle, aperture shape, incident intensity distribution, and lens usage, enabling practical analysis. - Capable of importing various 3D CAD data. - There is also a cluster version available. (※1) FDTD method: A type of computational technique for calculating the behavior of electromagnetic waves, abbreviated as Finite-Difference Time-Domain Method. It solves Maxwell's equations using finite difference methods in time and space. (※2) Surface plasmon enhancement: A phenomenon where the electric field is enhanced by the electrons on a metal surface.

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Applications/Examples of results

Detailed information

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  [Analysis Case: 1] ■Analysis of Silicon Solar Cells Using Moth-Eye Type Anti-Reflection Coating The reflection characteristics of solar cells with a moth-eye structure added to the surface of the silicon substrate are being analyzed.

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  [Analysis Case: 2] ■Analysis of Silicon Solar Cells Using Localized Surface Plasmons of Gold Nanoparticles The behavior of the electromagnetic field scattered within the silicon substrate is analyzed using the localized surface plasmons of gold nanoparticles. The dispersion characteristics of gold and silicon are also taken into account.

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  [Analysis Case: 3] ■ Analysis of the Absorption Characteristics of Solar Cells Using Silicon Nanowire Arrays We are analyzing the absorption characteristics of silicon nanowires in response to planar electromagnetic waves.

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  [Analysis Case: 4] ■Crosstalk Analysis of CMOS Image Sensors Taking into account the medium characteristics such as color filters and silicon, we model the CMOS image sensor and analyze the crosstalk of light within the device.

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  [Analysis Case: 5] ■Analysis of Surface Plasmons We are analyzing the phenomenon where surface plasmons are confined and propagate at the interface between a metal and a dielectric.

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  [Analysis Case: 6] ■Superlens Effect Using Left-Handed Materials This is an analysis case of the superlens effect using left-handed materials that exhibit negative refractive index.

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  [Analysis Case: 7] ■Analysis using oblique incidence functionality under periodic boundary conditions This analyzes the condition where a uniform plane wave is obliquely incident at an arbitrary angle within the analysis area under periodic boundary conditions.

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  [Analysis Case: 8] ■Analysis of the Transmission Characteristics of Photonic Crystals

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  [Analysis Case: 9] ■ Thermal Analysis of Optical Fiber Probe Model