Inspection equipment that demonstrates high speed and high detection capability with our unique optical system and imaging technology!
The "Wafer Crack and Edge Inspection Device" is an inspection device capable of detecting multiple types of defects with a single unit. It can quickly capture and detect wafer cracks that are difficult to find through visual inspection, as well as edge defects on the wafer's outer circumference. We offer this device at a low price, so please feel free to contact us. 【Features】 ■ Low price ■ High speed and high detection capability ■ Capable of detecting multiple types of defects with one unit *For more details, please refer to the catalog or feel free to contact us.
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basic information
【Detectable Defects】 ■ Crack Inspection - Cracks - Dimples - So Marks - Slips - Mounds / Elevations ■ Edge Inspection - Cracks - Scratches - Film Residue - Chipping - Foreign Objects *For more details, please refer to the catalog or feel free to contact us.
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For more details, please refer to the catalog or feel free to contact us.
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Company information
Showa Electric Research Institute Co., Ltd. is a research and development-oriented electronic equipment manufacturer focused on measurement and control, specializing in image processing devices, non-destructive testing measurement devices, and various inspection equipment. We handle products such as "ACF bonding inspection devices" and "wafer inspection devices," establishing a comprehensive system from hardware and software development to manufacturing and maintenance. We also accept the development of products for specific users and contract manufacturing, so please feel free to contact us.