Customizable! A lineup of offline inspection devices capable of high-resolution testing.
The "MICRO ACE Series" is an offline inspection device handled by Ayaha Engineering. The "OMI-UL," which can achieve a resolution of 0.7μ to ultra-high resolution inspection, can be linked with 3D measuring instruments and allows for the measurement of defect depth with the push of a button from the inspection map. Additionally, we offer a compact type "OMI-SP" and a simplified inspection model "OMI-FE" that can perform inspections at 10 to 100μ. 【Features】 <OMI-UL> ■ Capable of ultra-high resolution inspection from 0.7μ ■ Wide depth of field allows for full shape imaging of defects without variation due to focus ■ A rich combination of optical systems and defect type discrimination through image processing ■ Defect analysis possible with 3D measurement using a laser microscope (optional) ■ Active in research and development scenes for advanced materials such as displays, electronic materials, and batteries *For more details, please contact us.
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basic information
【Other Features】 <OMI-SP> ■ Suitable for inspection with a resolution of 2.8μ to 10μ ■ Ideal for automating and quantifying microscope inspections by humans ■ Capable of detecting μm-level surface defects, polarized bright spots, and scratches on films and glass <OMI-FE> ■ Allows for simple inspections starting from a resolution of 10μ ■ Measures A4 size in approximately 10 seconds ■ Inspection result maps can be printed at a 1:1 scale, allowing for direct comparison between the map and defect samples *For more details, please contact us.
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Applications/Examples of results
【Usage】 ■ During product development ■ During process improvement ■ At the final stage, etc. *For more details, please refer to the PDF document or feel free to contact us.
Company information
In order to survive the intensifying market competition, efforts towards "quality control" and "quality improvement" can be said to be a common challenge for all manufacturing industries. At Ayaha Engineering, we have over 30 years of experience and know-how in the development of surface defect inspection equipment. Our business philosophy is to "master the essence of advanced technology and support the development of the manufacturing industry and technological innovation through the creation and proposal of product services that meet our customers' needs."
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