Support for inspection of various electronic components! Precision research of TOTAL TEST SOLUTION!
This is an introduction to Seiken Co., Ltd., which handles contact probes used for electrical testing, semiconductor wafer inspection probe cards, and IC sockets. We offer a lineup of products including "contact probes" that cater to both standard and special specifications, "IC sockets" that can be configured with housing materials suited to specific applications, and "probe cards" that accommodate various inspection conditions, including narrow pitch through fine processing technology. Examples of inspection conditions: - Support for narrow pitch (MIN P=80μ) - High current testing (pre-process testing of IGBT devices) - Non-magnetic testing (probes made from non-magnetic materials) Leveraging the technology we have cultivated over many years, we continue to develop solutions that provide a more efficient inspection environment and meet more detailed requests. An overview of our products is available in the documentation. [Contents] ■ Introduction ■ Product and technology introduction (Contact Probes) - Introduction of new product technology ■ Technology introduction (IC sockets, probe cards) ■ Other various products and services (precision processing, etc.) *For more details, please refer to the PDF document or feel free to contact us.
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basic information
【Featured Products】 ■Contact Probes Introduction of New Technology - Doubled allowable current per probe. Excellent CNT technology for high current testing. - Reduced replacement hassle. Durable rare metal probes. - Revised internal structure. New bias probes for stable resistance value measurement. ■IC Sockets - Non-magnetic compatible sockets. - High heat resistance sockets. ■Probe Cards - Probe cards compatible with min 80μ pitch. - Probe cards for high current load testing. *For more details, please refer to the PDF document or feel free to contact us.
Price information
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Applications/Examples of results
【Contact Probe】 Electrical inspection device head Connector Board function inspection LCD panel lighting inspection Battery charge and discharge inspection 【Probe Card】 Semiconductor front-end inspection 【IC Socket】 Semiconductor back-end inspection *For more details, please refer to the PDF document or feel free to contact us.
catalog（3）
Download All Catalogs![Semiconductor Inspection Equipment [IC Sockets and Probe Cards] Introduction Catalog](https://image.mono.ipros.com/public/catalog/image/01/ae1/438737/IPROS85003276613993070126.jpeg?w=120&h=170)
Company information
Our company is a manufacturer that has developed and designed inspection equipment essential for quality assurance. Since our founding in 1984, we have started manufacturing and selling various inspection jigs, specializing in probe pins and their application products. Since then, we have responded to customer needs in various markets, including semiconductor component inspection jigs such as probe cards and IC sockets, as well as liquid crystal panel inspection jigs. As a leading company in the industry, we have refined and honed our precision processing and assembly technology over many years. Keeping pace with the changing times, as a "TOTAL TEST SOLUTION" provider, we will continue to tackle the challenges in inspection operations with various products and services as a good partner for our customers. In recent years, we have also been providing the technology and know-how we have accumulated in producing our products to our customers through our EMS business. In addition to our unique skills, we also offer various support in manufacturing by matching our customers with partner companies and related firms. Seiken will always challenge itself, create new value, and pave the way for the future of manufacturing in Japan.
![[Research Material] The Global Market for High Voltage Differential Probes](https://image.mono.ipros.com/public/product/image/640/2001470674/IPROS94688335380223973911.jpeg?w=280&h=280)
