It is possible to measure the hardness and Young's modulus of thin films or sample surfaces ranging from several hundred nanometers to several micrometers with high precision.
The use of thin films that improve the mechanical properties of products, such as diamond-like carbon (DLC) films commonly used in automotive parts, metal plating films on connector electrode surfaces, and hard coat films for protecting resin surfaces, is increasing. With a nanoindenter, it is possible to obtain mechanical properties such as hardness and Young's modulus with high precision and automatically for micron-level thin films, which are difficult to measure with conventional indentation tests. Additionally, various options such as heating and scratching can also be added.
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basic information
Nanoindentation performs quasi-static indentation tests on samples to obtain their mechanical properties. By analyzing the depth of indentation at maximum load and the corresponding curve, a variety of information can be obtained, including hardness, Young's modulus, and the work rates of plastic and elastic deformation. This testing method (nanoindentation method) is defined by the international standard ISO 14577.
Price information
From 15 million yen～ It varies depending on the configuration. Please contact us separately for details.
Price range
P7
Delivery Time
※2-3 months
Applications/Examples of results
Measurement of hardness and Young's modulus of thin film materials such as protective films for sliding parts (hard films like DLC), automotive coatings, and plating films.
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Company information
Toyo Technica Co., Ltd. introduces advanced measurement instruments and technologies from overseas in fields such as information communication, machine control/vibration noise, physical properties/energy, EMC/large antennas, marine/special equipment, software development support, nanoimaging, and medical systems. We also provide our own developed products that leverage our many years of accumulated know-how. In the field of nanoimaging, we handle products such as the composite analysis device 'Xe Plasma FIB-SEM System,' which can process and observe specific areas at high speed and over a wide range.