東陽テクニカ Product Lineup

"LiteScope 2.0" is an atomic force microscope that can be easily integrated with scanning electron microscopes. It can be easily mounted on SEMs and is immediately usable, and it can also be used as a standalone AFM. It is compatible with FIB, GIS, EDS, and other common SEM accessories. 【Features】 ■ Extension of SEM functionality ■ Highly precise correlated imaging ■ Quick and easy alignment to areas of interest ■ Elimination of sample contamination risk ■ Extension of 2D SEM images to 3D *For more details, please refer to the PDF document or feel free to contact us.

• Electron microscope
• Other microscopes
• Other inspection equipment and devices

The "iMicro" is a multifunctional nanoindenter that can accommodate both the InForce1000 and InForce50 heads. By combining two heads of the nanoindenter, it is possible to obtain the two-dimensional mechanical properties of the sample. Using the Continuous Stiffness Measurement (CSM/CSR) method, we obtained a profile of the surface hardness and confirmed that the surface hardness significantly increased due to anodizing treatment. 【Compatible Heads】 ■InForce1000 ■InForce50 *For more details, please refer to the PDF document or feel free to contact us.

• Testing Equipment and Devices
• Analytical Equipment and Devices
• Other measurement, recording and measuring instruments

The use of thin films that improve the mechanical properties of products, such as diamond-like carbon (DLC) films commonly used in automotive parts, metal plating films on connector electrode surfaces, and hard coat films for protecting resin surfaces, is increasing. With a nanoindenter, it is possible to obtain mechanical properties such as hardness and Young's modulus with high precision and automatically for micron-level thin films, which are difficult to measure with conventional indentation tests. Additionally, various options such as heating and scratching can also be added.

• Metal bearings
• plastic
• Strength Testing Equipment