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  6. Support for narrow pitch in stacked probes

Support for narrow pitch in stacked probes

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last updated:May 15, 2019

インクス
インクス
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It is possible to accommodate Kelvin measurements in a narrow range by utilizing a narrow pitch!

We would like to introduce our company's "stacked probes" and their compatibility with narrow pitch applications. The "stacked probes" can handle stable resistance values, high voltage, and current. Furthermore, they can make contacts at a minimum pitch of 0.05mm with closely arranged contacts, semiconductor lead parts, and connector contacts, enabling narrow pitch compatibility that was not achievable with conventional spring probes. 【Features】 ■ Stable resistance values, high voltage, and current compatibility ■ Contact possible at a minimum pitch of 0.05mm ■ Compatible with Kelvin measurements ■ Two-terminal measurements for each measurement point *For more details, please refer to the PDF document or feel free to contact us.

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2019-05-13_09h11_32.png

Support for narrow pitch in stacked probes

2019-05-13_09h11_32.png
2019-05-13_09h11_32.png
  • Related Link - http://imcth.co.jp/probe_01/

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Support for narrow pitch in stacked probes

Support for narrow pitch in stacked probes

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インクス

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Machine elements and parts

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Inks Co., Ltd. provides precision probes, precision parts, and precision models (such as desktopZERO). In the probe business, we achieve high performance with innovative technology, including spring probes, high-frequency probes, and stacked probes. To pursue high performance, we do not use automated machines and manufacture our products by hand. In addition, in the product business, we incorporate the foundational press technology with the experience, knowledge, and know-how cultivated in the consumer business to solve our customers' problems.

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