"Layered Probe (Patented Technology)" *Catalog with Case Studies Included

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last updated：Oct 11, 2018

インクス

Official site

From narrow pitch measurements of 0.05 mm to high current power semiconductors.

The stacked probe, being a single part, has no structural conductive loss, allowing for direct measurement of current values and achieving stable contact resistance values. Additionally, it can accommodate a minimum pitch of 0.05 mm, enabling Kelvin measurements using narrow pitches and ensuring stable measurements. The excellent characteristics of the stacked probe not only allow for the arrangement of probes in narrow pitches but also demonstrate performance as a probe for power semiconductors that apply large currents. 【Features】 ■ Stable contact resistance values provide powerful precision measurements. ■ Capable of handling large currents and high voltages, contributing to application and measurement for power semiconductors. ■ Compatible with narrow pitches (up to a maximum of 0.05 pitch). ■ Adjustable contact load. 【Examples】 ◎ Contacting in narrow pitches and multiple points. ◎ Ensures reliable contact with BGA for stable Kelvin measurements. ◎ Provides stable contact with lead frames of solder plating. ◎ Suitable for narrow spaces (for LED inspection equipment). *You can view examples from the PDF. Please feel free to contact us for more details.

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basic information

■The maximum current value that can be flowed changes depending on the number of probe layers. ■Support for non-standard products - By selecting the thickness of the insulating film, the probe pitch can be arranged. *Changing the thickness of the insulating film will alter the dielectric strength value. - The contact pressure can be selected by specifying the thickness of the spring plate. ◎At Inks, we also accept the production of special specifications and jig processing according to customer requests.