Student experiments, operation confirmation and setting adjustment of AFM/SPM.
This is a test sample for atomic force microscopy and scanning probe microscopy. It can be used for student experiments, as well as for verifying the operation and adjusting the settings of AFM/SPM.
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basic information
This is a calibration grating for atomic force microscopes and scanning probe microscopes. It includes nine types of gratings, allowing you to select the appropriate grating based on the type of calibration and evaluation. In addition to calibration work for the equipment, it can also be used for test measurements in student experiments.
Price range
P2
Delivery Time
※The delivery time varies depending on the model and quantity, so please feel free to contact us.
Applications/Examples of results
- Student experiments - Operation verification and setting adjustment of AFM/SPM
Detailed information
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- SiC/0.75, SiC/1.5 Samples based on 6H-SiC(0001) can be calibrated for vertical movement at sub-nanometer intervals. You can choose a step height of 0.75nm or 1.5nm for each layer.
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This is a sample of linearized plasmid pGem7zf+ (Promega) deposited on mica using SmaI endonuclease. It consists of linear DNA molecules (3000 bp) with a molecular density of 0.5-7 molecules/μm², and the DNA length is uniformly distributed on the surface at 1009 nm (typical). The recommended humidity during image acquisition is 3-5%.
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・PFM03 <Usage Details> ・Setting of the piezoelectric response force microscopy (PFM) mode ・Optimization of modulation voltage parameters (frequency, phase, amplitude) ・Test measurements in PFM mode
Line up（4）
| Model number | overview |
|---|---|
| SiC/0.75 | Sample based on 6H-SiC(0001). Vertical movement can be calibrated at sub-nanometer intervals. Step height is 0.75nm. |
| SiC/1.5 | Sample based on 6H-SiC(0001). Vertical movement can be calibrated at sub-nanometer intervals. Step height is 1.5nm. |
| DNA01 | Sample of plasmid pGem7zf+ (Promega) linearized with SmaI endonuclease deposited on mica. |
| PFM03 | Sample used for setting up the piezoelectric response force microscopy (PFM) mode. |
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Company information
MSH Systems Co., Ltd. introduces and provides cutting-edge scientific technologies and their products from both domestic and international sources to universities, research institutions, and corporate clients in Japan as quickly as possible, contributing to the realization of a richer future society. With 30 years of sales and service experience in the science and technology fields, along with strong trust relationships and responsible execution with our clients, we will act with all our efforts to become a good partner for everyone. Our ultimate goal is to ensure the satisfaction of not only our customers and manufacturers but also everyone involved with us.