For piezoelectric response microscopy
The AR-PPLN test sample is a convenient and reliable sample for practicing, setting up, and inspecting piezoelectric response microscopy (PFM) techniques. It includes imaging and point hysteresis loops, but its applications are not limited to these. This reference sample is composed of permanently polarized striped domains to facilitate the identification and optimization of PFM parameters.
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basic information
The AR-PPLN (Periodically Poled Lithium Niobate) test sample is made from a 3 mm × 3 mm transparent LiNbO3 die (thickness 0.5 mm). Its active region consists of a repeating pattern of domain stripes polarized in opposite directions, aligned parallel to one axis of the die and covering the entire surface of the die. The pitch of the domains is 10 μm. We offer three types of AR-PPLN: - Fixed type on a 15 mm diameter steel pack - Fixed type on a 3-inch × 1-inch slide glass - Unfixed type (the PPLN sample in the center of the photo uses this type) ● For other functions and details, please contact us.
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Applications/Examples of results
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Company information
Oxford Instruments, independent from the University of Oxford in the UK, has had innovation as the driving force behind its growth and success for over 60 years. Our core technologies are utilized in a wide range of applications, including next-generation semiconductors, new-generation communications, advanced materials, healthcare, life sciences, quantum technology, and space science, contributing to various projects aimed at achieving a greener world sooner.
