This is a dynamic characteristic testing device for measuring power devices packaged as modules.
Achieves switching time, VCE (SUS), and load short-circuit measurement with a single unit. Ideal for measuring dynamic characteristics (AC characteristics) in high and low temperature environments. Low Ls measurement is possible thanks to Copel Electronics' unique know-how. Chamber for heating/cooling is also available.
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basic information
Target Element: N-Ch IGBT/IPM/P-MOS FET Diode SW TIME: VCC: 1000V IC: 1000A VG: ±20V VCE(SUS): VCC: 1000V IC: 2000A VG: ±20V VCE(SUS): 2500V Load Short Circuit: VCC: 1000V IC: 5000A VG: ±20V Inductance: L: 3μH to 1mH Waveform Acquisition: D.S.O. Temperature Setting Range: -40℃ to +150℃ *This specification is an example. For details, please contact us.
Applications/Examples of results
This is a dynamic characteristic measurement device (AC characteristic measurement device) aimed at various power modules of semiconductors (IGBT, IPM, P-MOS FET, SiC, GaN, Diodes, etc.). There is also a chamber type with optimal temperature management functions, particularly suitable for automotive applications that require high reliability.
Company information
Koper Electronics is located in Atsugi City, Kanagawa Prefecture, and is an advanced technology company that develops, designs, and manufactures measurement and inspection equipment for high-power semiconductors used in hybrid cars (HV) and electric vehicles (EV) under its own brand. In Japan, it has received high praise from major electronics and automobile manufacturers as its customers. Additionally, the "ZeroCon," which maintains a 0°C environment with high precision, has been highly regarded by users in scientific research and calibration facilities as an indispensable device.
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