This is a dynamic characteristic testing device for measuring power devices in chip form. There are also many proven inspection devices for testing in wafer form.
This is a dynamic characteristic measurement device (AC characteristic measurement device) aimed at individual wafer chips of various semiconductors (IGBT, P-MOS FET, SiC, GaN, Diodes, etc.). It enables dynamic characteristic testing during shipping inspections and acceptance inspections of individual chips, as well as during the process before package sealing.
Inquire About This Product
basic information
Target Element: N-Ch IGBT/P-MOS FET Diode SW TIME: VCC: 1000V IC: 1000A VG: ±20V VCE(SUS): VCC: 1000V IC: 2000A VG: ±20V VCE(SUS): 2500V Inductance: L: 3μH to 1mH Waveform Acquisition: D.S.O. Others: Palette supply and classification storage function *This specification is an example. Please contact us for details.*
Applications/Examples of results
High-precision positioning and probing technology enable dynamic characteristic (AC characteristic) testing of individual chips. Achieved low Ls measurement with a newly developed contact method.
Company information
Koper Electronics is located in Atsugi City, Kanagawa Prefecture, and is an advanced technology company that develops, designs, and manufactures measurement and inspection equipment for high-power semiconductors used in hybrid cars (HV) and electric vehicles (EV) under its own brand. In Japan, it has received high praise from major electronics and automobile manufacturers as its customers. Additionally, the "ZeroCon," which maintains a 0°C environment with high precision, has been highly regarded by users in scientific research and calibration facilities as an indispensable device.
![Data writing and reading purposes [Pickup mirror]](https://image.mono.ipros.com/public/product/image/33c/2000787814/IPROS07572605486587643592.png?w=280&h=280)
