It is a static characteristic testing device for measuring power devices in a chip-only configuration. There are also many proven testing devices for wafer state.
It is a test device for the static characteristics of the chip (DC characteristics). It supports from microcurrents to high power.
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basic information
Target Element: N-Ch IGBT / IPM / MOS-FET / Diode Main Measurement Items: IGES(±) (Gate-Emitter Leakage Current) VGE(off) (Gate-Emitter Cutoff Voltage) ICES (Output Stage Leakage Current) VCES (Output Stage Breakdown Voltage) VCE(SAT) (Output Stage Saturation Voltage) Others: - Measurement conditions are set interactively with the HOST PC - Measurement data is recorded in CSV format - Room temperature / high temperature measurements *This specification is an example. Please contact us for details.*
Applications/Examples of results
It is a test device for the static characteristics of the chip (DC characteristics). It is a custom specification that accommodates microcurrents to high power.
Company information
Koper Electronics is located in Atsugi City, Kanagawa Prefecture, and is an advanced technology company that develops, designs, and manufactures measurement and inspection equipment for high-power semiconductors used in hybrid cars (HV) and electric vehicles (EV) under its own brand. In Japan, it has received high praise from major electronics and automobile manufacturers as its customers. Additionally, the "ZeroCon," which maintains a 0°C environment with high precision, has been highly regarded by users in scientific research and calibration facilities as an indispensable device.
![[Equipment Introduction] Discovering abnormalities in the implementation status 'Image Inspection' 2](https://image.mono.ipros.com/public/product/image/e64/2000604360/IPROS94306387668928717510.jpeg?w=280&h=280)