The incident light on the sample is in a pseudo-parallel state, reducing interference from the device!
The "OD-10" is a spectrophotometer capable of measuring optical densities up to OD10, which could not be measured with conventional spectrophotometers. It is suitable for measuring various low transmittance samples such as multilayer membrane filters, high-concentration filters, light-shielding films, and high-concentration solutions. By combining the lock-in amplifier method and photon counting method, high-precision measurements have become possible. 【Features】 ■ Capable of measuring optical densities up to OD10 in the visible light range (wavelengths 350–700nm) ■ Reduces multiple reflected light from the sample and stray light from the device ■ Incident light on the sample is pseudo-parallel light ■ Reduces interference spectra originating from the device *For more details, please refer to the PDF document or feel free to contact us.
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【Specifications (Excerpt)】 ■ Measurement Method: Lock-in amplifier method and photon counting method ■ Measurement Wavelength Range: 350–700nm ■ Measurement Wavelength Purity: 0.15–6nm (continuously variable) ■ Incident Light Size: Approximately Φ10mm ■ Measurement Data Storage Format: Text storage (CSV format) *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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Our company was established in September 1977 as a subsidiary of Japan Spectroscopy Co., Ltd., primarily targeting the research and development departments of universities, government agencies, and corporations. Our goal is to manufacture spectroscopic and optical measurement instruments that faithfully meet customer demands. To date, we have produced numerous unique devices, including solar cell evaluation systems (spectral sensitivity measurement for silicon and dye-sensitized solar cells), spectral response measurement systems (pricing for silicon photodiodes and radiation thermometers), optical element measurement systems (transmission and reflection measurement for lenses and prisms), monochromatic light irradiation systems, and vacuum ultraviolet spectrophotometers.