Achieved compactness, high resolution, and high stability compared to conventional vacuum-compatible types!
The "KV-202" is a tabletop vacuum ultraviolet spectrophotometer that uses our proprietary nitrogen purge type spectrometer (KV-200). Light from a deuterium lamp that emits ultraviolet radiation enters the spectrometer through a focusing system, is dispersed by a diffraction grating, and monochromatic light is extracted. The extracted monochromatic light is split into two optical paths; one is detected for monitoring to compensate for changes in the light source. The other employs a semi-double beam method to irradiate the sample, enabling highly stable transmittance spectrum measurements. 【Features】 ■ Transmittance spectrum measurement in the wavelength range of 120 to 300 nm (vacuum ultraviolet region) ■ Achieves high resolution and high stability with the nitrogen purge type spectrometer ■ Suitable for the evaluation of special films and substrates *For more details, please refer to the PDF materials or feel free to contact us.
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【Specifications (Excerpt)】 ■ Light source: Deuterium lamp 30W ■ Measurement wavelength range: 120–300nm ■ Measurement reproducibility: ±0.3%T ■ Wavelength reproducibility: Within 0.1nm ■ Size of measurement sample: Minimum 3×3mm to maximum 12×12mm ■ Thickness of measurement sample: Minimum 1mm to maximum 3mm *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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Our company was established in September 1977 as a subsidiary of Japan Spectroscopy Co., Ltd., primarily targeting the research and development departments of universities, government agencies, and corporations. Our goal is to manufacture spectroscopic and optical measurement instruments that faithfully meet customer demands. To date, we have produced numerous unique devices, including solar cell evaluation systems (spectral sensitivity measurement for silicon and dye-sensitized solar cells), spectral response measurement systems (pricing for silicon photodiodes and radiation thermometers), optical element measurement systems (transmission and reflection measurement for lenses and prisms), monochromatic light irradiation systems, and vacuum ultraviolet spectrophotometers.
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