Peritech's imaging diagnostic equipment is a highly reliable image analysis solution specialized in machine vision, based on AI deep learning.
■ No need for algorithm development for inspection and defect detection Peritec's solution does not require complex algorithm development. You only need to input the pass/fail status for a certain number of image samples. ■ Inspection with accuracy comparable to visual inspection Peritec's solution automatically corrects for size, angle, shading, etc., just like the human eye. There is no need to strictly pursue the size, angle, or lighting of the workpiece as in traditional image inspection. ■ Enables appearance inspection that was extremely difficult to program with conventional methods It can handle tasks such as quality judgment of textiles and classification of products, which were difficult with traditional methods. Why not leave inspections that you think "the human eye can see" to Peritec's solution? ■ Seamless integration of AI deep learning with measurement and control devices using LabVIEW By combining the versatility of LabVIEW with Peritec's technological capabilities, we can customize and provide a wide variety of sensing and robotics programs.
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basic information
Expertise in Diagnosis ■ Positioning and Detection of Features Extracts single or multiple features from images and detects their positions. For example, it can detect and distinguish features even in cases of OCR with very noisy backgrounds or counting of complex, randomly piled parts. As long as a sample image with marked features to be extracted is prepared, learning is possible. ■ Detection of Defects and Anomalies Detects exceptions and visual defects. For example, scratches on cosmetic surfaces, assembly defects in devices, or weaving patterns in textiles. By simply learning the appearance of objects, it is possible to distinguish many other issues as well. Additionally, it separates specific areas such as defects from other areas. For instance, foreign substances in medical non-woven fabrics or the mesh of lace. All these targets are learned simply based on differences in appearance. ■ Classification of Targets Classifies targets. For example, sorting products, classifying welding seams, and distinguishing between acceptable and unacceptable defects. Learning is based on a collection of labeled images, enabling classification. As long as labeled images that correspond to each class are prepared, learning can be conducted.
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Applications/Examples of results
- Appearance inspection of machined parts - Inspection of mounted circuit boards - Inspection of printing and printing misalignment - Detection of the position of appearance features and counting of quantities - Detection of surface defects - Color pattern and design inspection - Product sorting based on appearance
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Company information
Peritech derives its name from "peripheral" and "technology," and we are proposing unique technology research and development in T&M (measurement systems and testing equipment) to everyone. We hope to be of service as your peripheral devices. At Peritech, we utilize 'LabVIEW,' a graphical programming language specialized for measurement and testing, to conduct technology research and development and proposals for T&M (measurement systems and testing machines). Since our founding, we have carried out a diverse range of developments, totaling over 4,000 projects. We provide high-performance, low-cost, and compact T&M systems such as RFID testers, ECU testers, and IC testers. We have been certified as a platinum alliance partner, ranking at the top among partner companies of National Instruments (NI), the sole developer of LabVIEW in Japan, and we maintain a strong trust relationship with NI. This enables us to provide the best development consulting to our customers. Moving forward, Peritech will continue to offer comprehensive and high-quality solutions leveraging the latest LabVIEW technology to support the growth of many customers.