X-ray fluoroscopy and CT examination device: Case of LED malfunction observation (X-ray fluoroscopic observation)
[Video Available] Captured the moment of defect occurrence! Introducing a case of X-ray observation using LED.
We would like to introduce a case where the moment a surface-mounted LED is damaged due to overload was captured through X-ray observation. In this case, the surface-mounted LED was powered on, and the voltage and current were gradually increased from the rated values, capturing the process that led to the LED becoming non-functional due to overload. Additionally, you can view the process of the LED becoming non-functional in a video. 【LED Failure Observation Case】 ■ After becoming non-functional - Melting, disconnection - Change in the shape of the wire loop - Delamination of the phosphor - Changes in the shape and size of voids *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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【Usage】 ■ X-ray fluoroscopy and CT examination equipment *For more details, please refer to the PDF document or feel free to contact us.
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.