[Technical Information] Measurement Principle of Spectroscopic Ellipsometry - What is Polarization? *Materials Available
Polarization, ellipsometer, Brewster angle, etc.! Clearly introduced with diagrams and graphs. Demonstrations available.
This document introduces the measurement principles of a spectroscopic ellipsometer. It covers topics such as "polarization," which refers to light with a regular vibration direction of electric and magnetic fields, the principles of the ellipsometer, and optical interference. The content is presented clearly along with diagrams and graphs, so please take a moment to read it. 【Contents (excerpt)】 ■ What is polarization ■ Changes to the sample surface ■ What is an ellipsometer ■ Principles of the ellipsometer ■ What is the Brewster angle 〈 We will hold a webinar! *Details 〉 ■ Theme: Explanation of the procedure for creating analysis models for spectroscopic ellipsometers – Beginner's edition – ■ Date and Time ・ April 22 (Thursday) 10:00 AM ・ May 13 (Thursday) 4:00 PM ■ Content Using a typical sample structure as an example, we will explain the procedure for creating analysis models. Explanation of analysis using effective medium approximation models, Cauchy models, and Tauc-Lorentz models. ■ Participation Please check our company website (link below) for details. *For more information, please refer to the PDF document or feel free to contact us. *If you would like a demo, please indicate "Demo request" using the contact button below.
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【Other Published Content】 ■ About Optical Interference ■ Analytical Approach ■ Analytical Process ■ Measurement Result Images ■ Contact Information *For more details, please refer to the PDF document or feel free to contact us.
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Semilab is a comprehensive measurement device manufacturer that supports research and manufacturing of cutting-edge technologies worldwide. We handle non-contact CV measurement devices, lifetime measurement devices, spectroscopic ellipsometers, photoluminescence, DLTS systems, sheet resistance measurement devices, nanoindenters, AFM, and more for the inspection of semiconductor wafers and devices. Please feel free to contact us for specifications and pricing of our devices.